Interfacial structures of random copolymer/ homopolymer bilayers analyzed by neutron reflectometry

Masashi Harada, Naoya Torikai, Daisuke Kawaduchi, Atsushi Takano, Yushu Matsushita, Timothy Charlton, Robert Dalgliesh

Research output: Contribution to conferencePaperpeer-review

Abstract

The interfacial structures have been investigated for random copolymer/ homopolymer systems of poly(4-trimethylsilylstyrene-ran-styrene) and polyisoprene by neutron reflectometry at various mole fractions of the random copolymers and annealing temperatures of the bilayers. The cross-section profile showed the interface-broadening by the increase of the PTMSS fraction and the decrease of the annealing temperature.

Original languageEnglish
Pages1130
Number of pages1
StatePublished - 2006
Externally publishedYes
Event55th SPSJ Annual Meeting - Nagoya, Japan
Duration: May 24 2006May 26 2006

Conference

Conference55th SPSJ Annual Meeting
Country/TerritoryJapan
CityNagoya
Period05/24/0605/26/06

Keywords

  • Interface
  • Neutron reflectivity
  • Poly(4-trimethylsilylstyrene)
  • Polyisoprene
  • Polystyrene
  • Random copolymer

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