Abstract
The interfacial structures have been investigated for random copolymer/ homopolymer systems of poly(4-trimethylsilylstyrene-ran-styrene) and polyisoprene by neutron reflectometry at various mole fractions of the random copolymers and annealing temperatures of the bilayers. The cross-section profile showed the interface-broadening by the increase of the PTMSS fraction and the decrease of the annealing temperature.
Original language | English |
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Pages | 1130 |
Number of pages | 1 |
State | Published - 2006 |
Externally published | Yes |
Event | 55th SPSJ Annual Meeting - Nagoya, Japan Duration: May 24 2006 → May 26 2006 |
Conference
Conference | 55th SPSJ Annual Meeting |
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Country/Territory | Japan |
City | Nagoya |
Period | 05/24/06 → 05/26/06 |
Keywords
- Interface
- Neutron reflectivity
- Poly(4-trimethylsilylstyrene)
- Polyisoprene
- Polystyrene
- Random copolymer