Abstract
In-situ synchrotron x-ray observations reveal that the ferroelectric behavior of epitaxial (001) PbTiO3 thin films grown on (110) DyScO3 substrates depends on both film thickness and interfacial electrical properties. A 92-nm-thick film was found to exhibit an a/c domain structure with a ferroelectric Curie temperature similar to that theoretically predicted based on the strain state. In contrast, 6-nm-thick films contained only c-oriented domains, and the ferroelectric behavior was found to depend strongly on the nature of the electrical boundary condition at the buried interface.
| Original language | English |
|---|---|
| Article number | 132901 |
| Journal | Applied Physics Letters |
| Volume | 104 |
| Issue number | 13 |
| DOIs | |
| State | Published - Mar 31 2014 |
| Externally published | Yes |