Interdiffusion of Elements During Ultrasonic Additive Manufacturing

Michael Pagan, Christian Petrie, Donovan Leonard, Niyanth Sridharan, Steven Zinkle, Sudarsanam Suresh Babu

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

This paper reports evidence for enhanced elemental interdiffusion during ultrasonic additive manufacturing (UAM) across metal boundaries of copper-aluminum, nickel-gold, and nickel-gold-aluminum. The high solute interdiffusion measured by energy dispersive X-ray spectroscopy line scans is rationalized with calculated vacancy concentrations orders of magnitude larger than thermal equilibrium values. The above estimates are supported by existing knowledge related to defect physics and UAM thermal cycles. The observation of pronounced elemental mixing are evidence for the presence of enhanced non-equilibrium immiscible metal interdiffusion during UAM processing.

Original languageEnglish
Pages (from-to)1142-1157
Number of pages16
JournalMetallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Volume52
Issue number3
DOIs
StatePublished - Mar 2021

Funding

This research is sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory (ORNL), managed by UT-Battelle LLC, for the US Department of Energy. Adam Hehr and Mark Norfolk (Fabrisonic LLC, Columbus, Ohio) fabricated the embedded fiber samples. Dorothy Coffey assisted in TEM lamella fabrication. Metallography and optical microscopy were performed in the ORNL Manufacturing Demonstration Facility (MDF). SEM and EDS Bruker analysis were performed in the ORNL High Temperature Materials Laboratory (HTML). TEM was performed in the ORNL Low Activation Materials Development and Analysis Laboratory (LAMDA).

FundersFunder number
U.S. Department of Energy
Oak Ridge National Laboratory
UT-Battelle

    Fingerprint

    Dive into the research topics of 'Interdiffusion of Elements During Ultrasonic Additive Manufacturing'. Together they form a unique fingerprint.

    Cite this