| Original language | English |
|---|---|
| Pages (from-to) | 80-81 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 12 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 2006 |
Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components
- Jaret J. Frafjord
- , Steven J. Dekanich
- , Abe W. Mathews
- , Traig W. Savage
- , Chris Kammerud
- , Besma Abidi
- , David L. Page
- , Mongi A. Abidi
Research output: Contribution to journal › Article › peer-review