Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

Jaret J. Frafjord; Steven J. Dekanich; Abe W. Mathews; Traig W. Savage; Chris Kammerud; Besma Abidi; David L. Page; Mongi A. Abidi

doi:10.1017/S1431927606160420

Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

Jaret J. Frafjord
, Steven J. Dekanich
, Abe W. Mathews
, Traig W. Savage
, Chris Kammerud
, Besma Abidi
, David L. Page
, Mongi A. Abidi

Geospatial Science and Human Security Di

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	80-81
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606160420
State	Published - Aug 2006

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10.1017/S1431927606160420

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@article{0fc96dac1aa44314b61f27ea7dea9807,

title = "Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components",

author = "Frafjord, \{Jaret J.\} and Dekanich, \{Steven J.\} and Mathews, \{Abe W.\} and Savage, \{Traig W.\} and Chris Kammerud and Besma Abidi and Page, \{David L.\} and Abidi, \{Mongi A.\}",

year = "2006",

month = aug,

doi = "10.1017/S1431927606160420",

language = "English",

volume = "12",

pages = "80--81",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

AU - Frafjord, Jaret J.

AU - Dekanich, Steven J.

AU - Mathews, Abe W.

AU - Savage, Traig W.

AU - Kammerud, Chris

AU - Abidi, Besma

AU - Page, David L.

AU - Abidi, Mongi A.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750869500

U2 - 10.1017/S1431927606160420

DO - 10.1017/S1431927606160420

M3 - Article

AN - SCOPUS:33750869500

SN - 1431-9276

VL - 12

SP - 80

EP - 81

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

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