Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

Jaret J. Frafjord; Steven J. Dekanich; Abe W. Mathews; Traig W. Savage; Chris Kammerud; Besma Abidi; David L. Page; Mongi A. Abidi

doi:10.1017/S1431927606160420

Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

Jaret J. Frafjord, Steven J. Dekanich, Abe W. Mathews, Traig W. Savage, Chris Kammerud, Besma Abidi, David L. Page, Mongi A. Abidi

Geospatial Science and Human Security Di

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	80-81
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606160420
State	Published - Aug 2006

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10.1017/S1431927606160420

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title = "Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components",

author = "Frafjord, {Jaret J.} and Dekanich, {Steven J.} and Mathews, {Abe W.} and Savage, {Traig W.} and Chris Kammerud and Besma Abidi and Page, {David L.} and Abidi, {Mongi A.}",

year = "2006",

month = aug,

doi = "10.1017/S1431927606160420",

language = "English",

volume = "12",

pages = "80--81",

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issn = "1431-9276",

publisher = "Oxford University Press",

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T1 - Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

AU - Frafjord, Jaret J.

AU - Dekanich, Steven J.

AU - Mathews, Abe W.

AU - Savage, Traig W.

AU - Kammerud, Chris

AU - Abidi, Besma

AU - Page, David L.

AU - Abidi, Mongi A.

PY - 2006/8

Y1 - 2006/8

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U2 - 10.1017/S1431927606160420

DO - 10.1017/S1431927606160420

M3 - Article

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SN - 1431-9276

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SP - 80

EP - 81

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Integration of large-chamber scanning electron microscopy and image-stitching techniques to characterize full-sized components

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