TY - GEN
T1 - Integrating Climate Variable Data in Machine Learning Models for Predictive Analytics of Tomato Yields in California
AU - Zhu, Tianze
AU - Wu, Junyi
AU - Tan, Tingyi
AU - Wang, Shuheng
AU - Munasinghe, Thilanka
AU - Tubbs, Heidi
AU - Anyamba, Assaf
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Traditionally, agricultural forecasting has relied on empirical methods and basic statistical analysis, such as applying average values from previous years' yields or using a simple linear fit for next year's predictions. However, the emergence of data-driven approaches, particularly machine learning algorithms, has revolutionized yield prediction in agriculture. Machine learning techniques have demonstrated their potential to provide accurate predictions. However, existing models often rely on a limited number of input variables for crop yield predictions, which makes them only suitable for specific scenarios. In this study, we have developed four distinct machine learning-based predictors, incorporating various climate factors, including daytime temperature, nighttime temperature, precipitation (rainfall), vegetation index, and evapotranspiration as input variables to predict tomato acreage yields in counties of California, USA. Our results show that regression models constructed using neural networks and linear regression exhibited better performance than other predictors, achieving an average accuracy rate of 70% to 80%. Compared to most of the existing crop yield predictors, our models offer versatility while maintaining a desirable level of predictive accuracy. Expanding the number of input variables, such as nitrogen fertilizer usage etc, and introducing larger spatial and temporal high-resolution datasets for model training can improve our model performance, enabling us to obtain better results in tomato yield prediction.
AB - Traditionally, agricultural forecasting has relied on empirical methods and basic statistical analysis, such as applying average values from previous years' yields or using a simple linear fit for next year's predictions. However, the emergence of data-driven approaches, particularly machine learning algorithms, has revolutionized yield prediction in agriculture. Machine learning techniques have demonstrated their potential to provide accurate predictions. However, existing models often rely on a limited number of input variables for crop yield predictions, which makes them only suitable for specific scenarios. In this study, we have developed four distinct machine learning-based predictors, incorporating various climate factors, including daytime temperature, nighttime temperature, precipitation (rainfall), vegetation index, and evapotranspiration as input variables to predict tomato acreage yields in counties of California, USA. Our results show that regression models constructed using neural networks and linear regression exhibited better performance than other predictors, achieving an average accuracy rate of 70% to 80%. Compared to most of the existing crop yield predictors, our models offer versatility while maintaining a desirable level of predictive accuracy. Expanding the number of input variables, such as nitrogen fertilizer usage etc, and introducing larger spatial and temporal high-resolution datasets for model training can improve our model performance, enabling us to obtain better results in tomato yield prediction.
KW - Climate Variables
KW - Evapotranspiration
KW - Machine Learning
KW - NDVI
KW - Neural Network
UR - http://www.scopus.com/inward/record.url?scp=85184980631&partnerID=8YFLogxK
U2 - 10.1109/BigData59044.2023.10386285
DO - 10.1109/BigData59044.2023.10386285
M3 - Conference contribution
AN - SCOPUS:85184980631
T3 - Proceedings - 2023 IEEE International Conference on Big Data, BigData 2023
SP - 3538
EP - 3546
BT - Proceedings - 2023 IEEE International Conference on Big Data, BigData 2023
A2 - He, Jingrui
A2 - Palpanas, Themis
A2 - Hu, Xiaohua
A2 - Cuzzocrea, Alfredo
A2 - Dou, Dejing
A2 - Slezak, Dominik
A2 - Wang, Wei
A2 - Gruca, Aleksandra
A2 - Lin, Jerry Chun-Wei
A2 - Agrawal, Rakesh
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE International Conference on Big Data, BigData 2023
Y2 - 15 December 2023 through 18 December 2023
ER -