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Integrated tests of a high speed VXS switch card and 250 MSPS flash ADCs

  • H. Dong
  • , C. Cuevas
  • , D. Curry
  • , E. Jastrzembski
  • , F. Barbosa
  • , J. Wilson
  • , M. Taylor
  • , B. Raydo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

14 Scopus citations

Abstract

High trigger rate nuclear physics experiments proposed for the 12 GeV upgrade at the Thomas Jefferson National Accelerator Facility create a need for new high speed digital systems for energy summing. Signals from electronic detectors will be captured with the Jefferson Lab FADC module, which collects and processes data from 16 charged particle sensors with 10 or 12 bit resolution at 250MHz sample rate. Up to sixteen FADC modules transfer energy information to a central energy summing module for each readout crate. The sums from the crates are combined to form a global energy sum that is used to trigger data readout for all modules. The Energy Sum module and FADC modules have been designed using the VITA-41 VME64 switched serial (VXS) standard. The VITA-41 standard defines payload and switch slot module functions, and offers an elegant engineered solution for Multi-Gigabit serial transmission on a standard VITA-41 backplane. The Jefferson Lab Energy Sum module receives data serially at a rate of up to 6 Giga-bits per second from the FADC modules. Both FADC and Energy Sum modules have been designed and assembled and this paper describes the integrated tests using both high speed modules in unison.

Original languageEnglish
Title of host publication2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC
Pages831-833
Number of pages3
DOIs
StatePublished - 2007
Externally publishedYes
Event2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC - Honolulu, HI, United States
Duration: Oct 27 2007Nov 3 2007

Publication series

NameIEEE Nuclear Science Symposium Conference Record
Volume1
ISSN (Print)1095-7863

Conference

Conference2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC
Country/TerritoryUnited States
CityHonolulu, HI
Period10/27/0711/3/07

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