Abstract
Single crystal platelets of AlN were successfully grown on 6H-SiC(0001) by a novel technique designed to suppress SiC decomposition, promote two-dimensional growth, and eliminate cracking in the AlN. X-ray diffractometry and synchrotron white beam X-ray topography demonstrate that the final AlN single crystal is of high structural quality.
Original language | English |
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Pages (from-to) | 757-762 |
Number of pages | 6 |
Journal | Physica Status Solidi (A) Applied Research |
Volume | 188 |
Issue number | 2 |
DOIs | |
State | Published - Nov 2001 |