Abstract
High Temperature X-ray Diffraction (HTXRD) is a very powerful tool for studies of reaction kinetics, phase transformations, and lattice thermal expansion of advanced materials. Accurate temperature measurement is a critical part of the technique. Traditionally, thermocouples, thermisters, and optical pyrometers have been used for temperature control and measurement, and temperature could only be measured at a single point. Infrared imaging was utilized in this study to characterize the thermal gradients resulting from various sample and furnace configurations in a commercial strip heater furnace. Furnace configurations include a metallic strip heater, with and without a secondary surround heater, or a surround heater alone. Sample configurations include low and high thermal conductivity powders and solids. The IR imaging results have been used to calibrate sample temperatures in the HTXRD furnace.
| Original language | English |
|---|---|
| Pages (from-to) | 377-385 |
| Number of pages | 9 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3700 |
| State | Published - 1999 |
| Event | Proceedings of the 1999 Thermosense XXI - Orlando, FL, USA Duration: Apr 6 1999 → Apr 8 1999 |