Infrared imaging of temperature distribution in a high temperature x-ray diffraction furnace

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Abstract

High Temperature X-ray Diffraction (HTXRD) is a very powerful tool for studies of reaction kinetics, phase transformations, and lattice thermal expansion of advanced materials. Accurate temperature measurement is a critical part of the technique. Traditionally, thermocouples, thermisters, and optical pyrometers have been used for temperature control and measurement, and temperature could only be measured at a single point. Infrared imaging was utilized in this study to characterize the thermal gradients resulting from various sample and furnace configurations in a commercial strip heater furnace. Furnace configurations include a metallic strip heater, with and without a secondary surround heater, or a surround heater alone. Sample configurations include low and high thermal conductivity powders and solids. The IR imaging results have been used to calibrate sample temperatures in the HTXRD furnace.

Original languageEnglish
Pages (from-to)377-385
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3700
StatePublished - 1999
EventProceedings of the 1999 Thermosense XXI - Orlando, FL, USA
Duration: Apr 6 1999Apr 8 1999

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