Abstract
The spectroscopy and imaging capabilities of scanning probe microscopes (SPMs) depends on data processing to link the microsecond time scale of cantilever motion to the millisecond time scale of image acquisition. The advanced data processing electronics helped to use non-sinusoidal data acquisition and processing methods in SPM. The fast data acquisition and flexible control electronics for real-time control of the SPM has improved the data processing of SPMs. The SPM can obtain spatially resolved data by rastering the probe across a sample and linking parameters determined from probe response to a particular pixel. Researchers are making efforts to develop SPM based on active control of the tip trajectory, active feedbacks to lower thermomechanical noise, and advanced Fourier modes.
Original language | English |
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Pages (from-to) | 20-23 |
Number of pages | 4 |
Journal | Reading for the R and D Community |
Volume | 50 |
Issue number | 4 |
State | Published - Aug 2008 |