Influence of miscut y 2O 3-stabilized ZrO 2 substrates on the azimuthal domain structure and ferroelectric properties of epitaxial La-substituted Bi 4Ti 3O 12 films

Sung Kyun Lee; Dietrich Hesse; Ulrich Gösele; Ho Nyung Lee

doi:10.1063/1.2345576

Influence of miscut y ₂O ₃-stabilized ZrO ₂ substrates on the azimuthal domain structure and ferroelectric properties of epitaxial La-substituted Bi ₄Ti ₃O ₁₂ films

Sung Kyun Lee, Dietrich Hesse, Ulrich Gösele, Ho Nyung Lee

Materials Science and Technology Div

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

We have investigated the influence of both miscut angle and miscut direction of Y ₂O ₃-stabilized ZrO ₂ (YSZ) (100) single crystal substrates on the azimuthal domain structure of SrRuO ₃ electrode layers as well as of La-substituted Bi ₄Ti ₃O ₁₂ (BLT) ferroelectric thin films, both grown on these substrates by pulsed laser deposition. X-ray diffraction Φ scan and pole figure characterizations revealed that the YSZ[011] miscut direction is more effective to uniformly reduce the number of azimuthal domain variants in the films than the YSZ[001] miscut direction. The BLT films on YSZ(100) substrates with miscut angle of 5° and [011] miscut direction involve only half the number of azimuthal domains, compared to the BLT films on exactly cut YSZ(100) substrates. Atomic force microscopy and plan-view transmission electron microscopy also confirmed that almost all BLT grains on these miscut YSZ(100) substrates are arranged along only two (out of four) specific azimuthal directions. The BLT films on YSZ(100) substrates with 5° miscut towards YSZ[011] showed an about 1.3 times higher remanent polarization (P _r=12.5 μC/cm ²) than the BLT films on exactly cut YSZ(100) substrates (P _r=9.5 μC/cm ²), due most probably to a lower areal density of azimuthal domain boundaries. It thus appears that reducing the structural domains can be an effective way to further enhance the ferroelectric properties of multiply twinned, epitaxial ferroelectric films.

Original language	English
Article number	064101
Journal	Journal of Applied Physics
Volume	100
Issue number	6
DOIs	https://doi.org/10.1063/1.2345576
State	Published - 2006

Funding

This research was supported by Deutsche Forschungsgemeinschaft (DFG) via the Group of Researchers FOR 404 at Martin Luther University Halle-Wittenberg. One of the authors (H.N.L) was supported by the Division of Materials Sciences and Engineering, Office of Basic Energy Sciences, U.S. Department of Energy, under Contract No. DE-AC05-00OR22725 with Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC.

Funders	Funder number
U.S. Department of Energy	DE-AC05-00OR22725
Basic Energy Sciences
Oak Ridge National Laboratory
Division of Materials Sciences and Engineering
Deutsche Forschungsgemeinschaft

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title = "Influence of miscut y 2O 3-stabilized ZrO 2 substrates on the azimuthal domain structure and ferroelectric properties of epitaxial La-substituted Bi 4Ti 3O 12 films",

abstract = "We have investigated the influence of both miscut angle and miscut direction of Y 2O 3-stabilized ZrO 2 (YSZ) (100) single crystal substrates on the azimuthal domain structure of SrRuO 3 electrode layers as well as of La-substituted Bi 4Ti 3O 12 (BLT) ferroelectric thin films, both grown on these substrates by pulsed laser deposition. X-ray diffraction Φ scan and pole figure characterizations revealed that the YSZ[011] miscut direction is more effective to uniformly reduce the number of azimuthal domain variants in the films than the YSZ[001] miscut direction. The BLT films on YSZ(100) substrates with miscut angle of 5° and [011] miscut direction involve only half the number of azimuthal domains, compared to the BLT films on exactly cut YSZ(100) substrates. Atomic force microscopy and plan-view transmission electron microscopy also confirmed that almost all BLT grains on these miscut YSZ(100) substrates are arranged along only two (out of four) specific azimuthal directions. The BLT films on YSZ(100) substrates with 5° miscut towards YSZ[011] showed an about 1.3 times higher remanent polarization (P r=12.5 μC/cm 2) than the BLT films on exactly cut YSZ(100) substrates (P r=9.5 μC/cm 2), due most probably to a lower areal density of azimuthal domain boundaries. It thus appears that reducing the structural domains can be an effective way to further enhance the ferroelectric properties of multiply twinned, epitaxial ferroelectric films.",

author = "Lee, {Sung Kyun} and Dietrich Hesse and Ulrich G{\"o}sele and Lee, {Ho Nyung}",

year = "2006",

doi = "10.1063/1.2345576",

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AU - Lee, Sung Kyun

AU - Hesse, Dietrich

AU - Gösele, Ulrich

AU - Lee, Ho Nyung

PY - 2006

Y1 - 2006

N2 - We have investigated the influence of both miscut angle and miscut direction of Y 2O 3-stabilized ZrO 2 (YSZ) (100) single crystal substrates on the azimuthal domain structure of SrRuO 3 electrode layers as well as of La-substituted Bi 4Ti 3O 12 (BLT) ferroelectric thin films, both grown on these substrates by pulsed laser deposition. X-ray diffraction Φ scan and pole figure characterizations revealed that the YSZ[011] miscut direction is more effective to uniformly reduce the number of azimuthal domain variants in the films than the YSZ[001] miscut direction. The BLT films on YSZ(100) substrates with miscut angle of 5° and [011] miscut direction involve only half the number of azimuthal domains, compared to the BLT films on exactly cut YSZ(100) substrates. Atomic force microscopy and plan-view transmission electron microscopy also confirmed that almost all BLT grains on these miscut YSZ(100) substrates are arranged along only two (out of four) specific azimuthal directions. The BLT films on YSZ(100) substrates with 5° miscut towards YSZ[011] showed an about 1.3 times higher remanent polarization (P r=12.5 μC/cm 2) than the BLT films on exactly cut YSZ(100) substrates (P r=9.5 μC/cm 2), due most probably to a lower areal density of azimuthal domain boundaries. It thus appears that reducing the structural domains can be an effective way to further enhance the ferroelectric properties of multiply twinned, epitaxial ferroelectric films.

AB - We have investigated the influence of both miscut angle and miscut direction of Y 2O 3-stabilized ZrO 2 (YSZ) (100) single crystal substrates on the azimuthal domain structure of SrRuO 3 electrode layers as well as of La-substituted Bi 4Ti 3O 12 (BLT) ferroelectric thin films, both grown on these substrates by pulsed laser deposition. X-ray diffraction Φ scan and pole figure characterizations revealed that the YSZ[011] miscut direction is more effective to uniformly reduce the number of azimuthal domain variants in the films than the YSZ[001] miscut direction. The BLT films on YSZ(100) substrates with miscut angle of 5° and [011] miscut direction involve only half the number of azimuthal domains, compared to the BLT films on exactly cut YSZ(100) substrates. Atomic force microscopy and plan-view transmission electron microscopy also confirmed that almost all BLT grains on these miscut YSZ(100) substrates are arranged along only two (out of four) specific azimuthal directions. The BLT films on YSZ(100) substrates with 5° miscut towards YSZ[011] showed an about 1.3 times higher remanent polarization (P r=12.5 μC/cm 2) than the BLT films on exactly cut YSZ(100) substrates (P r=9.5 μC/cm 2), due most probably to a lower areal density of azimuthal domain boundaries. It thus appears that reducing the structural domains can be an effective way to further enhance the ferroelectric properties of multiply twinned, epitaxial ferroelectric films.

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Influence of miscut y ₂O ₃-stabilized ZrO ₂ substrates on the azimuthal domain structure and ferroelectric properties of epitaxial La-substituted Bi ₄Ti ₃O ₁₂ films

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