Influence of MgO substrate miscut on domain structure of pulsed laser deposited SrxBa1-xNb2O6 as characterized by x-ray diffraction and spectroscopic ellipsometry

C. M. Rouleau; G. E. Jellison; D. B. Beach

doi:10.1063/1.1572464

Influence of MgO substrate miscut on domain structure of pulsed laser deposited Sr_xBa_1-xNb₂O₆ as characterized by x-ray diffraction and spectroscopic ellipsometry

C. M. Rouleau, G. E. Jellison, D. B. Beach

Functional Hybrid Nanomaterials

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Abstract

The influence of MgO substrate on domain structure of pulsed laser deposited Sr_xBa_1-xNb₂O₆ was studied by using spectroscopic ellipsometry. The spectroscopic ellipsometry measurements were performed to measure surface and intersurface roughness, film thickness and extinction coefficient of the films. The result showed the presence of four antiphase domains in a thin 185±1 nm film.

Original language	English
Pages (from-to)	2990-2992
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	18
DOIs	https://doi.org/10.1063/1.1572464
State	Published - May 5 2003

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title = "Influence of MgO substrate miscut on domain structure of pulsed laser deposited SrxBa1-xNb2O6 as characterized by x-ray diffraction and spectroscopic ellipsometry",

abstract = "The influence of MgO substrate on domain structure of pulsed laser deposited SrxBa1-xNb2O6 was studied by using spectroscopic ellipsometry. The spectroscopic ellipsometry measurements were performed to measure surface and intersurface roughness, film thickness and extinction coefficient of the films. The result showed the presence of four antiphase domains in a thin 185±1 nm film.",

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AU - Jellison, G. E.

AU - Beach, D. B.

PY - 2003/5/5

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N2 - The influence of MgO substrate on domain structure of pulsed laser deposited SrxBa1-xNb2O6 was studied by using spectroscopic ellipsometry. The spectroscopic ellipsometry measurements were performed to measure surface and intersurface roughness, film thickness and extinction coefficient of the films. The result showed the presence of four antiphase domains in a thin 185±1 nm film.

AB - The influence of MgO substrate on domain structure of pulsed laser deposited SrxBa1-xNb2O6 was studied by using spectroscopic ellipsometry. The spectroscopic ellipsometry measurements were performed to measure surface and intersurface roughness, film thickness and extinction coefficient of the films. The result showed the presence of four antiphase domains in a thin 185±1 nm film.

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Influence of MgO substrate miscut on domain structure of pulsed laser deposited Sr_xBa_1-xNb₂O₆ as characterized by x-ray diffraction and spectroscopic ellipsometry

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