Influence of doping and thickness on domain avalanches in lead zirconate titanate thin films

Travis Peters, Wanlin Zhu, Marti Checa, Liam Collins, Susan Trolier-Mckinstry

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4 Scopus citations

Abstract

In undoped lead zirconate titanate films of 1-2 μm thick, domain walls move in clusters with a correlation length of approximately 0.5-2 μm. Band excitation piezoresponse force microscopy mapping of the piezoelectric nonlinearity revealed that niobium (Nb) doping increases the average concentration or mobility of domain walls without changing the cluster area of correlated domain wall motion. In contrast, manganese (Mn) doping reduces the contribution of mobile domain walls to the dielectric and piezoelectric responses without changing the cluster area for correlated motion. In both Nb and Mn doped films, the cluster area increases and the cluster density drops as the film thickness increases from 250 to 1250 nm. This is evident in spatial maps generated from the analysis of irreversible to reversible ratios of the Rayleigh coefficients.

Original languageEnglish
Article number132906
JournalApplied Physics Letters
Volume122
Issue number13
DOIs
StatePublished - Mar 27 2023

Funding

This work was supported in part by the SCGSR Fellowship and Corresponding CNMS User Proposal, No. CNMS2022-B-999 (T.P. and S.T.-M.). Other funding was provided by the National Science Foundation (Grant Nos. NSF EEC-1160483 and DMR-2025439) and the Flaschen Professorship. PFM research was supported by the Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory.

FundersFunder number
Center for Nanophase Materials Sciences
SCGSRCNMS2022-B-999
National Science FoundationEEC-1160483, DMR-2025439
U.S. Department of Energy
Office of Science
Oak Ridge National Laboratory

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