Abstract
The high-temperature x-ray diffraction studies of mixed-conducting perovskite-type oxides were discussed. The three types of typical mixed-conducting perovskites were synthesized by solid-state reaction. The properties of perovskite such as lattice parameter, thermal expansion coefficient and phase stability were characterized by in situ high temperature x-ray diffraction. The results indicated high thermal expansion coefficients for perovskites and the lattice parameters were observed to be increasing linearly with temperature.
| Original language | English |
|---|---|
| Pages (from-to) | 1631-1633 |
| Number of pages | 3 |
| Journal | Journal of Materials Science Letters |
| Volume | 20 |
| Issue number | 17 |
| DOIs | |
| State | Published - Sep 1 2001 |
Funding
We gratefully acknowledge support by the National Advanced Materials Committee of China (NAMCC, No. 715-006-0121). We also thank the U.S. Department of Energy, Basic Energy Sciences, Division of Materials Sciences for the assistance in HTXRD analysis.
| Funders | Funder number |
|---|---|
| National Advanced Materials Committee of China | 715-006-0121 |
