In situ growth of epitaxial Bi2Sr2CaCu 2O8-x and Bi2Sr2CuO6-x films by pulsed laser ablation

S. Zhu, D. H. Lowndes, B. C. Chakoumakos, J. D. Budai, D. K. Christen, X. Y. Zheng, E. Jones, B. Warmack

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29 Scopus citations

Abstract

Pulsed-laser ablation has been used to grow epitaxial films of Bi 2Sr2CaCu2O8-x (Bi-2212) and Bi 2Sr2CuO6-x (Bi-2201) on (001) MgO with entirely in situ processing. The films' layer-stacking sequence, microstructure, and superconducting Tc are highly sensitive to the growth temperature and deposition rate. Pure Bi-2212 films exist over only a narrow temperature range. Pure Bi-2201 films appear at higher growth temperature, while lower growth temperature enhances the Bi-2223 phase, though it is mixed with Bi-2212. The phase homogeneity, in-plane connections among grains, and superconducting T c of Bi-2212 grown at a given temperature are greatly improved by reducing the deposition rate. Epitaxial Bi-2212 films grown at 740°C and 0.5 Hz (∼0.05 nm/s) have Tc0 (R=0)=71 K, with J c∼8×105 A/cm2 at 50 K and J c∼5×106 A/cm2 at 4.2 K.

Original languageEnglish
Pages (from-to)409-411
Number of pages3
JournalApplied Physics Letters
Volume63
Issue number3
DOIs
StatePublished - 1993

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