In situ electric-field-induced contrast imaging of electronic transport pathways in nanotube-polymer composites

Stephen Jesse, Michael A. Guillorn, Ilia N. Ivanov, Alexander A. Puretzky, Jane Y. Howe, Phillip F. Britt, David B. Geohegan

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Abstract

An electric-field-induced contrast mechanism for scanning electron microscopy is reported which permits the visualization of embedded nanomaterials inside various matrices with high contrast and high definition. The high contrast is proposed to result from localized enhancement of secondary electron emission from the nanomaterials due to electric-field-induced changes in their work functions. By utilizing a stage that allows in situ current-voltage measurements inside a scanning electron microscope, single-walled carbon nanotubes embedded within polymethyl methacrylate films were visualized directly. In addition to the rapid assessment of nanotube dispersion within polymers, electric-field-induced contrast imaging enables the determination of percolation pathways. From the contrast in the images, the relative voltage at all points in the electron micrograph can be determined, providing a new mechanism to understand electronic percolation through nanoscale networks.

Original languageEnglish
Article number013114
JournalApplied Physics Letters
Volume89
Issue number1
DOIs
StatePublished - 2006

Funding

This research was sponsored by NASA-Langley Research Center, the Laboratory-Directed Research and Development Program at ORNL, and the U.S. Department of Energy under Contract No. DE-AC05-00OR22725 with the Oak Ridge National Laboratory, managed by UT-Battelle, LLC.

FundersFunder number
NASA-Langley Research Center
U.S. Department of Energy
Oak Ridge National Laboratory

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