Abstract
Composite thick films of YBa2Cu3O7-x and silver have been prepared on alumina substrates using a paint-on method. It is found that thick films containing greater than about 10% silver by weight have greatly reduced normal resistivities for T>Tc (onset) and significantly enhanced Tc (R=0) as compared with undoped films processed under identical conditions. These results are interpreted in terms of enhanced grain growth and an improved coupling between grain boundaries because of proximity-induced electron pairing in the silver regions.
Original language | English |
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Pages (from-to) | 2256-2258 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 54 |
Issue number | 22 |
DOIs | |
State | Published - 1989 |
Externally published | Yes |