Abstract
The effect of gnomonic distortion on orientation indexing of electron backscatter diffraction patterns is explored through simulation of electron diffraction patterns for sample-to-detector geometries associated with transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Simulated data were analysed by computing a similarity index for both Hough transformed data and simulated patterns to determine the sensitivity of each method for detecting subtle differences in the effect of gnomonic distortions on electron diffraction patterns. These results indicate that the increased gnomonic distortions in electron diffraction patterns for a TKD geometry enhance the sensitivity for detecting subtle differences in interband angles. Additionally, the utilisation of a Hough transform-based indexing approach further enhances the sensitivity.
| Original language | English |
|---|---|
| Pages (from-to) | 85-94 |
| Number of pages | 10 |
| Journal | Journal of Microscopy |
| Volume | 285 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2022 |
Funding
This material is based upon work supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract number DE‐AC05‐00OR22725. This material is based upon the National Science Foundation work as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP‐1361571 and IIP‐1361503 and the National Science Foundation Graduate Research Fellowship for M.J. Burch under Grant No. DGE‐0946818. Any opinion, findings, conclusions or recommendations expressed in this material are those of the authors(s) and do not necessarily reflect the views of the National Science Foundation.
Keywords
- EBSD
- TKD
- gnomonic distortions