Impact of PSF modelling on the convergence rate and edge behaviour of em images in PET

K. Thielemans, E. Asma, S. Ahn, R. M. Manjeshwar, T. Deller, S. G. Ross, C. W. Stearns, A. Ganin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

36 Scopus citations

Abstract

EM reconstructions with point-spread-function (PSF) modelling is performed to increase the spatial resolution in PET images. These images exhibit slower initial convergence compared to reconstructions without PSF modelling. Furthermore, they exhibit more pronounced ringing around the edges of sharp features. We investigate the effect of different objects and PSF modelling on the convergence rate and edge behaviour of the EM algorithm in two stages: (i) at the initial iterations where the updates are large and (ii) at the later iterations where the updates are small. For the initial iterations, we compare the sharpness of the EM updates with and without PSF modelling. We show via simulations that the PSF modelling during the backprojection step causes smoother updates and consequently smoother images in the early stages of the EM algorithm. For the later iterations, we approximate the image as the ML image plus a perturbation term and develop an approximate update equation for the perturbation, which depends on the Hessian (H) of the log-likelihood. Based on this equation and the spectral analysis of H, we demonstrate how edges with ringing are preserved in the later stages of the algorithm and eliminated only for the case of noiseless data reconstruction with an unrealistically high number of iterations. In addition, we provide an intuitive explanation for the creation of the edge artefacts in terms of the PSF modelling during the backprojection step.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages3267-3272
Number of pages6
DOIs
StatePublished - 2010
Externally publishedYes
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: Oct 30 2010Nov 6 2010

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

Conference2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Country/TerritoryUnited States
CityKnoxville, TN
Period10/30/1011/6/10

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