Abstract
The role of scanning transmission electron microscopy (STEM) and conventional transmission electron microscopy (CTEM) in materials research is discussed. The application of aberration-corrected electron microscopy is materials analysis at the atomic scale is also discussed. The interpretability of Z-contrast STEM images allows the solution of unknown systems in a way that is difficult in CTEM. It is concluded that the best in materials analysis in provided by the the simultaneous combination of BF STEM images providing data for super-resolution and thickness sensitivity, Z-constrast images for structure determination and single-atom sensitivity, and electron energy loss spectroscopy for electronic and chemical information.
| Original language | English |
|---|---|
| Pages (from-to) | 42-48 |
| Number of pages | 7 |
| Journal | Materials Today |
| Volume | 7 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 2004 |
Funding
Thanks to Uwe Falke and Meiken Falke for Figs. 5 and 6 and to the UK Engineering and Physical Sciences Research Council (EPSRC) for the funding of SuperSTEM.