Imaging at the picoscale

Andrew Bleloch; Andrew Lupini

doi:10.1016/S1369-7021(04)00570-X

Imaging at the picoscale

Andrew Bleloch, Andrew Lupini

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

Abstract

The role of scanning transmission electron microscopy (STEM) and conventional transmission electron microscopy (CTEM) in materials research is discussed. The application of aberration-corrected electron microscopy is materials analysis at the atomic scale is also discussed. The interpretability of Z-contrast STEM images allows the solution of unknown systems in a way that is difficult in CTEM. It is concluded that the best in materials analysis in provided by the the simultaneous combination of BF STEM images providing data for super-resolution and thickness sensitivity, Z-constrast images for structure determination and single-atom sensitivity, and electron energy loss spectroscopy for electronic and chemical information.

Original language	English
Pages (from-to)	42-48
Number of pages	7
Journal	Materials Today
Volume	7
Issue number	12
DOIs	https://doi.org/10.1016/S1369-7021(04)00570-X
State	Published - Dec 2004

Funding

Thanks to Uwe Falke and Meiken Falke for Figs. 5 and 6 and to the UK Engineering and Physical Sciences Research Council (EPSRC) for the funding of SuperSTEM.

Funders	Funder number
Engineering and Physical Sciences Research Council

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10.1016/S1369-7021(04)00570-X

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Imaging at the picoscale

Abstract

Funding

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