Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films

Carol Thompson; D. D. Fong; R. V. Wang; F. Jiang; S. K. Streiffer; K. Latifi; J. A. Eastman; P. H. Fuoss; G. B. Stephenson

doi:10.1063/1.3013512

Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films

Carol Thompson
, D. D. Fong
, R. V. Wang
, F. Jiang
, S. K. Streiffer
, K. Latifi
, J. A. Eastman
, P. H. Fuoss
, G. B. Stephenson

Research output: Contribution to journal › Article › peer-review

57 Scopus citations

Abstract

Nanometer-period ferroelectric 180° stripe domains are observed in epitaxial PbTiO₃ films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.

Original language	English
Article number	182901
Journal	Applied Physics Letters
Volume	93
Issue number	18
DOIs	https://doi.org/10.1063/1.3013512
State	Published - 2008
Externally published	Yes

Funding

X-ray experiments were performed at the Advanced Photon Source beamline 12ID-D at Argonne National Laboratory, a U.S. Department of Energy Office of Science laboratory operated under Contract No. DE-AC02-06CH11357.

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10.1063/1.3013512

Cite this

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title = "Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films",

abstract = "Nanometer-period ferroelectric 180° stripe domains are observed in epitaxial PbTiO3 films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.",

author = "Carol Thompson and Fong, \{D. D.\} and Wang, \{R. V.\} and F. Jiang and Streiffer, \{S. K.\} and K. Latifi and Eastman, \{J. A.\} and Fuoss, \{P. H.\} and Stephenson, \{G. B.\}",

year = "2008",

doi = "10.1063/1.3013512",

language = "English",

volume = "93",

journal = "Applied Physics Letters",

issn = "0003-6951",

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T1 - Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films

AU - Thompson, Carol

AU - Fong, D. D.

AU - Wang, R. V.

AU - Jiang, F.

AU - Streiffer, S. K.

AU - Latifi, K.

AU - Eastman, J. A.

AU - Fuoss, P. H.

AU - Stephenson, G. B.

PY - 2008

Y1 - 2008

N2 - Nanometer-period ferroelectric 180° stripe domains are observed in epitaxial PbTiO3 films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.

AB - Nanometer-period ferroelectric 180° stripe domains are observed in epitaxial PbTiO3 films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.

UR - https://www.scopus.com/pages/publications/55849138007

U2 - 10.1063/1.3013512

DO - 10.1063/1.3013512

M3 - Article

AN - SCOPUS:55849138007

SN - 0003-6951

VL - 93

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

M1 - 182901

ER -

Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films

Abstract

Funding

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