Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films

Carol Thompson, D. D. Fong, R. V. Wang, F. Jiang, S. K. Streiffer, K. Latifi, J. A. Eastman, P. H. Fuoss, G. B. Stephenson

Research output: Contribution to journalArticlepeer-review

55 Scopus citations

Abstract

Nanometer-period ferroelectric 180° stripe domains are observed in epitaxial PbTiO3 films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.

Original languageEnglish
Article number182901
JournalApplied Physics Letters
Volume93
Issue number18
DOIs
StatePublished - 2008
Externally publishedYes

Funding

X-ray experiments were performed at the Advanced Photon Source beamline 12ID-D at Argonne National Laboratory, a U.S. Department of Energy Office of Science laboratory operated under Contract No. DE-AC02-06CH11357.

Fingerprint

Dive into the research topics of 'Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films'. Together they form a unique fingerprint.

Cite this