Abstract
Nanometer-period ferroelectric 180° stripe domains are observed in epitaxial PbTiO3 films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.
Original language | English |
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Article number | 182901 |
Journal | Applied Physics Letters |
Volume | 93 |
Issue number | 18 |
DOIs | |
State | Published - 2008 |
Externally published | Yes |
Funding
X-ray experiments were performed at the Advanced Photon Source beamline 12ID-D at Argonne National Laboratory, a U.S. Department of Energy Office of Science laboratory operated under Contract No. DE-AC02-06CH11357.