Identifying Degradation Modes of Photovoltaic Modules Using Unsupervised Machine Learning on Electroluminescense Images

Benjamin G. Pierce, Ahmad Maroof Karimi, Jiqi Liu, Roger H. French, Jennifer L. Braid

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

In order to characterize the degradation of solar modules, it is necessary to systematically recognize common signatures, such as cracks and corrosion. This information can be useful in a multitude of ways, such as comparing failure models of different brands or types of cells. The process of electroluminescence imaging can illuminate these signatures such that automated image processing techniques can identify them. Both supervised (via C.N.N.) and unsupervised models can be applied; the focus of this work is on improvement of the unsupervised approach. Feature extraction, a pivotal step to computer vision, is used to produce localized descriptions of relevant regions in an image. In order to identify features, numerous feature extraction algorithms, such as ORB [12] and FAST [11] have been applied, which yield feature vectors that are invariant to location, scale, and orientation, as opposed to Haralick features [4]. The resulting feature vectors can be clustered via hierarchical clustering and a bag of visual words can be constructed that can identify similar features across a sample set. This method allows clustering around a large number of unidentified features both apparent and non-obvious to human inspection, including cracking, busbar corrosion, and other common forms of degradation. The resultant model and code implementation can be used as a form of exploratory data analysis before labeling in preparation for supervised machine learning, or as a classifier on its own.

Original languageEnglish
Title of host publication2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1850-1855
Number of pages6
ISBN (Electronic)9781728161150
DOIs
StatePublished - Jun 14 2020
Externally publishedYes
Event47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada
Duration: Jun 15 2020Aug 21 2020

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2020-June
ISSN (Print)0160-8371

Conference

Conference47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Country/TerritoryCanada
CityCalgary
Period06/15/2008/21/20

Funding

This material is based upon work supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number DE-EE-0008550. JLB is supported by the U.S. Department of Energy (DOE) Office of Energy Efficiency and Renewable Energy administered by the Oak Ridge Institute for Science and Education (ORISE)for the DOE. ORISE is managed by Oak Ridge Associated Universities (ORAU) under DOE contract number DE-SC0014664.

FundersFunder number
Oak Ridge Institute for Science and Education
Solar Energy Technologies OfficeDE-EE-0008550
U.S. Department of Energy
Office of Energy Efficiency and Renewable Energy
Oak Ridge Associated UniversitiesDE-SC0014664
U.S. Department of Energy
Office of Energy Efficiency and Renewable Energy

    Keywords

    • PV module degradation
    • computer vision
    • electroluminescence imaging
    • unsupervised learning

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