Abstract
In order to characterize the degradation of solar modules, it is necessary to systematically recognize common signatures, such as cracks and corrosion. This information can be useful in a multitude of ways, such as comparing failure models of different brands or types of cells. The process of electroluminescence imaging can illuminate these signatures such that automated image processing techniques can identify them. Both supervised (via C.N.N.) and unsupervised models can be applied; the focus of this work is on improvement of the unsupervised approach. Feature extraction, a pivotal step to computer vision, is used to produce localized descriptions of relevant regions in an image. In order to identify features, numerous feature extraction algorithms, such as ORB [12] and FAST [11] have been applied, which yield feature vectors that are invariant to location, scale, and orientation, as opposed to Haralick features [4]. The resulting feature vectors can be clustered via hierarchical clustering and a bag of visual words can be constructed that can identify similar features across a sample set. This method allows clustering around a large number of unidentified features both apparent and non-obvious to human inspection, including cracking, busbar corrosion, and other common forms of degradation. The resultant model and code implementation can be used as a form of exploratory data analysis before labeling in preparation for supervised machine learning, or as a classifier on its own.
Original language | English |
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Title of host publication | 2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1850-1855 |
Number of pages | 6 |
ISBN (Electronic) | 9781728161150 |
DOIs | |
State | Published - Jun 14 2020 |
Event | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: Jun 15 2020 → Aug 21 2020 |
Publication series
Name | Conference Record of the IEEE Photovoltaic Specialists Conference |
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Volume | 2020-June |
ISSN (Print) | 0160-8371 |
Conference
Conference | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 |
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Country/Territory | Canada |
City | Calgary |
Period | 06/15/20 → 08/21/20 |
Funding
This material is based upon work supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number DE-EE-0008550. JLB is supported by the U.S. Department of Energy (DOE) Office of Energy Efficiency and Renewable Energy administered by the Oak Ridge Institute for Science and Education (ORISE)for the DOE. ORISE is managed by Oak Ridge Associated Universities (ORAU) under DOE contract number DE-SC0014664.
Keywords
- PV module degradation
- computer vision
- electroluminescence imaging
- unsupervised learning