Abstract
With the recent development of high-acquisition-speed pixelated detectors, 4D scanning transmission electron microscopy (4D-STEM) is becoming routinely available in high-resolution electron microscopy. 4D-STEM acts as a “universal” method that provides local information on materials that is challenging to extract from bulk techniques. It extends conventional STEM imaging to include super-resolution techniques and to provide quantitative phase-based information, such as differential phase contrast, ptychography, or Bloch wave phase retrieval. However, an important missing factor is the chemical and bonding information provided by electron energy loss spectroscopy (EELS). 4D-STEM and EELS cannot currently be acquired simultaneously due to the overlapping geometry of the detectors. Here, the feasibility of modifying the detector geometry to overcome this challenge for bulk specimens is demonstrated, and the use of a partial or defective detector for ptycholgaphic structural imaging is explored. Results show that structural information beyond the diffraction-limit and chemical information from the material can be extracted together, resulting in simultaneous multi-modal measurements, adding the additional dimensions of spectral information to 4D datasets.
| Original language | English |
|---|---|
| Article number | 2208162 |
| Journal | Small |
| Volume | 19 |
| Issue number | 37 |
| DOIs | |
| State | Published - Sep 13 2023 |
Funding
This work was supported by the U.S. Department of Energy (DOE), Office of Basic Energy Sciences (BES), Division of Materials Sciences and Engineering and by the Center for Nanophase Materials Sciences, a U.S. DOE Office of Science User Facility at Oak Ridge National Laboratory. Some of the technique development was supported by a DOE-BES Early Career Award. Microscopy was conducted at the CNMS. NYK and SC contributed equally to this work. Notice: This manuscript has been authored by UT-Battelle, LLC, under Contract No. DE-AC0500OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for the United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://www.energy.gov/downloads/doe-public-access-plan). Notice: This manuscript has been authored by UT‐Battelle, LLC, under Contract No. DE‐AC0500OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non‐exclusive, paid‐up, irrevocable, world‐wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for the United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan ( http://www.energy.gov/downloads/doe‐public‐access‐plan ). This work was supported by the U.S. Department of Energy (DOE), Office of Basic Energy Sciences (BES), Division of Materials Sciences and Engineering and by the Center for Nanophase Materials Sciences, a U.S. DOE Office of Science User Facility at Oak Ridge National Laboratory. Some of the technique development was supported by a DOE‐BES Early Career Award. Microscopy was conducted at the CNMS. NYK and SC contributed equally to this work.
Keywords
- 4D-scanning transmitting electron microscopy (STEM)
- electron energy loss spectroscopy (EELS)
- electron microscopy
- electron ptychography
- pixelated detectors