Highly Efficient Plasmon Induced Hot-Electron Transfer at Ag/TiO2Interface

Jia Song, Jinlin Long, Yawei Liu, Zihao Xu, Aimin Ge, Brandon D. Piercy, David A. Cullen, Ilia N. Ivanov, James R. McBride, Mark D. Losego, Tianquan Lian

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

Plasmon induced hot carrier transfer is a promising novel approach for solar energy conversion, but its practical application is often hindered by its low efficiency. This work demonstrates an unprecedented quantum efficiency of plasmonic hot-electron transfer of up to 53 ± 2% from 1.7 nm silver nanoparticles to anatase nanoporous TiO2 films at 400 nm excitation. This efficient hot-electron transfer consists of contributions of both hot electrons generated by plasmon decay through exciting Ag intraband transitions and Ag-to-TiO2 interfacial charge-transfer transitions. The efficiencies of both pathways increase at smaller Ag particle sizes from 5.9 to 1.7 nm, suggesting that decreasing particle sizes is a promising way toward efficient plasmonic hot-carrier extraction.

Original languageEnglish
Pages (from-to)1497-1504
Number of pages8
JournalACS Photonics
Volume8
Issue number5
DOIs
StatePublished - May 19 2021

Funding

This work was funded by the U.S. Department of Energy, Office of Basic Energy Sciences, Solar Photochemistry Program (grant DE-SC0008798). The Astrella setup used in this work was supported by the instrument grant (CHE-1726536). J.L. Long acknowledges financial support from the China Scholarship Council. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. Part of the HAADF-STEM and STEM-EDS imaging was performed at the Vanderbilt Institute of Nanoscale Science and Engineering.

Keywords

  • TiO
  • chemical interface damping
  • hot-electron transfer
  • plasmon-induced interfacial charge-transfer transition
  • silver nanoparticle
  • surface plasmon resonance

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