Abstract
Ferroelectrics are being increasingly called upon for electronic devices in extreme environments. Device performance and energy efficiency is highly correlated to clock frequency, operational voltage, and resistive loss. To increase performance it is common to engineer ferroelectric domain structure with highly-correlated electrical and elastic coupling that elicit fast and efficient collective switching. Designing domain structures with advantageous properties is difficult because the mechanisms involved in collective switching are poorly understood and difficult to investigate. Collective switching is a hierarchical process where the nano- and mesoscale responses control the macroscopic properties. Using chemical solution synthesis, epitaxially nearly-relaxed (100) BaTiO3 films are synthesized. Thermal strain induces a strongly-correlated domain structure with alternating domains of polarization along the [010] and [001] in-plane axes and 90° domain walls along the [011] or [01 (Formula presented.)] directions. Simultaneous capacitance–voltage measurements and band-excitation piezoresponse force microscopy revealed strong collective switching behavior. Using a deep convolutional autoencoder, hierarchical switching is automatically tracked and the switching pathway is identified. The collective switching velocities are calculated to be ≈500 cm s−1 at 5 V (7 kV cm−1), orders-of-magnitude faster than expected. These combinations of properties are promising for high-speed tunable dielectrics and low-voltage ferroelectric memories and logic.
Original language | English |
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Article number | 2201530 |
Journal | Advanced Science |
Volume | 9 |
Issue number | 29 |
DOIs | |
State | Published - Oct 14 2022 |
Funding
The Research Council of Norway is acknowledged for the support through the Norwegian Ph.D. Network on Nanotechnology for Microsystems, NanoNetwork, project number 221860/F60. The band‐excitation PFM and STEM imaging portions of this research were supported by the Center for Nanophase Materials Sciences (CNMS), which is a US DOE Office of Science User Facility at Oak Ridge National Laboratory. This work was completed as a part of CNMS User Proposal CNMS2021‐B‐00963. J.C.A. and S.Q. acknowledge support from the National Science Foundation under grant TRIPODS+X:RES‐1839234 and CSSI:2209135, the Office of Army Research and the Nano/Human Interfaces Presidential Initiative atLehigh University. J.C.A. acknowledges support from the Ralph E. Powe Junior Faculty Enhancement Award. This project has received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska‐Curie grant agreement No 899987. The Research Council of Norway is acknowledged for the support through the Norwegian Ph.D. Network on Nanotechnology for Microsystems, NanoNetwork, project number 221860/F60. The band-excitation PFM and STEM imaging portions of this research were supported by the Center for Nanophase Materials Sciences (CNMS), which is a US DOE Office of Science User Facility at Oak Ridge National Laboratory. This work was completed as a part of CNMS User Proposal CNMS2021-B-00963. J.C.A. and S.Q. acknowledge support from the National Science Foundation under grant TRIPODS+X:RES-1839234 and CSSI:2209135, the Office of Army Research and the Nano/Human Interfaces Presidential Initiative atLehigh University. J.C.A. acknowledges support from the Ralph E. Powe Junior Faculty Enhancement Award. This project has received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No 899987.
Funders | Funder number |
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Center for Nanophase Materials Sciences | |
University | |
National Science Foundation | RES-1839234, TRIPODS+X:RES‐1839234 |
Army Research Office | |
Oak Ridge National Laboratory | CNMS2021-B-00963 |
H2020 Marie Skłodowska-Curie Actions | |
Norges Forskningsråd | 221860/F60 |
Horizon 2020 | 899987 |
Keywords
- barium titanate
- capacitive hysteresis
- ferroelectric switching
- ferroelectrics
- neural network
- piezoresponse force microscopy