High-throughput growth temperature optimization of ferroelectric Sr xBa 1-xNb 2O 6 epitaxial thin films using a temperature gradient method

I. Ohkubo; H. M. Christen; Sergei V. Kalinin; G. E. Jellison; C. M. Rouleau; D. H. Lowndes

doi:10.1063/1.1650916

High-throughput growth temperature optimization of ferroelectric Sr _xBa _1-xNb ₂O ₆ epitaxial thin films using a temperature gradient method

I. Ohkubo, H. M. Christen, Sergei V. Kalinin, G. E. Jellison, C. M. Rouleau, D. H. Lowndes

Functional Hybrid Nanomaterials

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

The multisample film growth method on temperature-gradient substrate to optimize ferroelectric Sr _xBa _1-xNb ₂O ₆ epitaxial thin films was investigated. The ellipsometry and piezoelectric force microscopy (PFM) determined the optimal growth temperature for thin films on MgO(001) substrates to be 750°C. The variations in optical properties and ferroelectric domain structures were observed as function of growth temperature. The results from PFM show formation of uniform ferroelectric film for deposition temperatures above 750°C.

Original language	English
Pages (from-to)	1350-1352
Number of pages	3
Journal	Applied Physics Letters
Volume	84
Issue number	8
DOIs	https://doi.org/10.1063/1.1650916
State	Published - Feb 23 2004

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title = "High-throughput growth temperature optimization of ferroelectric Sr xBa 1-xNb 2O 6 epitaxial thin films using a temperature gradient method",

abstract = "The multisample film growth method on temperature-gradient substrate to optimize ferroelectric Sr xBa 1-xNb 2O 6 epitaxial thin films was investigated. The ellipsometry and piezoelectric force microscopy (PFM) determined the optimal growth temperature for thin films on MgO(001) substrates to be 750°C. The variations in optical properties and ferroelectric domain structures were observed as function of growth temperature. The results from PFM show formation of uniform ferroelectric film for deposition temperatures above 750°C.",

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AU - Jellison, G. E.

AU - Rouleau, C. M.

AU - Lowndes, D. H.

PY - 2004/2/23

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N2 - The multisample film growth method on temperature-gradient substrate to optimize ferroelectric Sr xBa 1-xNb 2O 6 epitaxial thin films was investigated. The ellipsometry and piezoelectric force microscopy (PFM) determined the optimal growth temperature for thin films on MgO(001) substrates to be 750°C. The variations in optical properties and ferroelectric domain structures were observed as function of growth temperature. The results from PFM show formation of uniform ferroelectric film for deposition temperatures above 750°C.

AB - The multisample film growth method on temperature-gradient substrate to optimize ferroelectric Sr xBa 1-xNb 2O 6 epitaxial thin films was investigated. The ellipsometry and piezoelectric force microscopy (PFM) determined the optimal growth temperature for thin films on MgO(001) substrates to be 750°C. The variations in optical properties and ferroelectric domain structures were observed as function of growth temperature. The results from PFM show formation of uniform ferroelectric film for deposition temperatures above 750°C.

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High-throughput growth temperature optimization of ferroelectric Sr _xBa _1-xNb ₂O ₆ epitaxial thin films using a temperature gradient method

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