High-resolution dielectric characterization of minerals: A step towards understanding the basic interactions between microwaves and rocks

T Monti, A Tselev, O Udoudo, IN Ivanov, C Dodds, SW Kingman

Research output: Contribution to journalArticlepeer-review

49 Scopus citations
Original languageAmerican English
Pages (from-to)8-21
Number of pages14
JournalInternational Journal of Mineral Processing
Volume151
DOIs
StatePublished - Jun 10 2016

Keywords

  • Dielectric properties
  • Hematite
  • Minerals
  • Raman spectra
  • SEM-EDX
  • Scanning microwave microscope

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