High-resolution dielectric characterization of minerals: A step towards understanding the basic interactions between microwaves and rocks

  • T Monti
  • , A Tselev
  • , O Udoudo
  • , IN Ivanov
  • , C Dodds
  • , SW Kingman

Research output: Contribution to journalArticlepeer-review

50 Scopus citations
Original languageAmerican English
Pages (from-to)8-21
Number of pages14
JournalInternational Journal of Mineral Processing
Volume151
DOIs
StatePublished - Jun 10 2016

Keywords

  • Dielectric properties
  • Hematite
  • Minerals
  • Raman spectra
  • SEM-EDX
  • Scanning microwave microscope

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