| Original language | English |
|---|---|
| Pages (from-to) | 648-649 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 14 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 2008 |
| Externally published | Yes |
High-resolution characterization of oxygen incorporation in erbium dihydride thin films
C. M. Parish, C. S. Snow, L. N. Brewer
Research output: Contribution to journal › Article › peer-review
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