Original language | English |
---|---|
Pages (from-to) | 648-649 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
Externally published | Yes |
High-resolution characterization of oxygen incorporation in erbium dihydride thin films
C. M. Parish, C. S. Snow, L. N. Brewer
Research output: Contribution to journal › Article › peer-review
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