@inbook{20dbf5301d464775a32f19c7a78693d3,
title = "High Pressure Transmission Electron Microscopy (TEM)",
abstract = "Transmission electron microscopy uses an electron beam to reveal the structural information of a sample. To this end, the instrument needs to be in a vacuum to prevent electrons from scattering from gases and hinder the accumulation of contamination inside the microscope. Today, it is possible to keep a small part of the volume surrounding the sample under elevated pressure to perform high-pressure transmission electron microscopy. This technique allows scientists to study materials under realistic conditions, which is particularly relevant in catalysis. This chapter will review the main options for performing high-pressure transmission electron microscopy and underline what can be achieved by highlighting some examples from the literature.",
keywords = "Battery materials, Electron energy-loss spectroscopy (EELS), Energy-dispersive X-ray spectroscopy (EDS), Environmental holder, Environmental transmission electron microscope (ETEM), Ex situ, Heterogeneous catalysis, In situ, Nanocatalyst, Transmission electron microscopy (TEM)",
author = "Foucher, {Alexandre C.} and Stach, {Eric A.}",
note = "Publisher Copyright: {\textcopyright} 2023, Springer Nature Switzerland AG.",
year = "2023",
doi = "10.1007/978-3-031-07125-6_19",
language = "English",
series = "Springer Handbooks",
publisher = "Springer Science and Business Media Deutschland GmbH",
pages = "381--407",
booktitle = "Springer Handbooks",
}