Abstract
The crystal quality of CdZnTe (CZT) was investigated by using high-energy transmission x-ray diffraction techniques. CdZnTe had shown excellent performance in hard hard x-ray and gamma detection. Collimated high-energy x-rays, produced by a superconducting wiggler at the National Synchrotron Light Source's X17B1 beamline, allow for a nondestructive characterization of thick CZT samples. The study lead to understanding the effects of defects on the device performances and ultimately to improving the quality CZT material required for device fabrication.
| Original language | English |
|---|---|
| Pages (from-to) | 804-810 |
| Number of pages | 7 |
| Journal | Journal of Electronic Materials |
| Volume | 34 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 2005 |
Funding
The authors gratefully acknowledge the support of all the staff, technicians, and scientists of the National Synchrotron Light Source, particularly Wolfgang Caliebe, Zhijian Yin, and Jean Jakoncic. Appreciation goes to the U.S. Department of Energy for the support provided by LDRD funding. Use of the NSLS was supported by U.S. Department of Energy Contract No. DE-AC02-76CH00016.
Keywords
- CZT
- Crystal quality
- Detectors characterization
- High-energy x-ray diffraction
- Rocking curve
- Topography