TY - JOUR
T1 - Heavy-ion damage to magnesium diboride films
T2 - Electrical transport-current characterization
AU - Kerchner, H. R.
AU - Cantoni, C.
AU - Paranthaman, M.
AU - Christen, D. K.
AU - Christen, H. M.
AU - Thompson, J. R.
AU - Miller, D. J.
PY - 2002
Y1 - 2002
N2 - The use of magnesium diboride in superconducting magnets, transmission lines, or other large-scale applications depends on the transport-current characteristics of this material in magnetic field, and how they compare to the properties of conventional and high-temperature superconductors. Thin films of boron grown on sapphire substrates during electron-beam evaporation were exposed to Mg vapor to produce 0.5-μm thick layers of the metallic compound MgB2. Four-terminal measurements of their voltage-current relations, E(J), were carried out before and after exposure to Bø=1-T and higher doses of 1-Gev U ions. These doses lowered critical temperatures Tc≈39 K less than 0.1 degree, raised the normal-state resistivity, and reduced the loss-free critical current density, Jc. Higher doses added little. The reduction of current densities was greater in the presence of applied magnetic field greater than 0.1 T.
AB - The use of magnesium diboride in superconducting magnets, transmission lines, or other large-scale applications depends on the transport-current characteristics of this material in magnetic field, and how they compare to the properties of conventional and high-temperature superconductors. Thin films of boron grown on sapphire substrates during electron-beam evaporation were exposed to Mg vapor to produce 0.5-μm thick layers of the metallic compound MgB2. Four-terminal measurements of their voltage-current relations, E(J), were carried out before and after exposure to Bø=1-T and higher doses of 1-Gev U ions. These doses lowered critical temperatures Tc≈39 K less than 0.1 degree, raised the normal-state resistivity, and reduced the loss-free critical current density, Jc. Higher doses added little. The reduction of current densities was greater in the presence of applied magnetic field greater than 0.1 T.
UR - http://www.scopus.com/inward/record.url?scp=0036353214&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0036353214
SN - 0272-9172
VL - 689
SP - 133
EP - 138
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
ER -