Abstract
Synchrotron-radiation photoemission was used to study the high- and low-temperature growth phases of ZnTe on GaSb(100). The deconvoluted core-level line shapes were used to construct structural models for the interface between these two compound semiconductors. In addition, the movement of the valence band and Fermi level was used to examine the heterojunction band offset for the low-temperature phase and the dopant incorporation for the high-temperature phase.
Original language | English |
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Pages (from-to) | 3940-3947 |
Number of pages | 8 |
Journal | Physical Review B |
Volume | 46 |
Issue number | 7 |
DOIs | |
State | Published - 1992 |
Externally published | Yes |