Growth of n-alkane films on a single-crystal substrate

Z. Wu, S. N. Ehrlich, B. Matthies, K. W. Herwig, Pengcheng Dai, U. G. Volkmann, F. Y. Hansen, H. Taub

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

The structure and growth mode of alkane films (n-CnH2n+2; n=4, 6, 7) adsorbed on a Ag(111) surface have been investigated by synchrotron X-ray scattering. New models are proposed for the butane (n=4) and hexane (n=6) monolayer and butane bilayer structures. Specular reflectivity scans reveal that growth of all films is preempted between two and three layers by nucleation of bulk particles oriented with a single bulk crystal plane parallel to the film. In the case of butane, the bulk particles also have a fixed azimuthal relationship with the film resulting in complete epitaxy.

Original languageEnglish
Pages (from-to)168-174
Number of pages7
JournalChemical Physics Letters
Volume348
Issue number3-4
DOIs
StatePublished - Nov 9 2001
Externally publishedYes

Funding

Acknowledgment is made to the US National Science Foundation under Grant Nos. DMR-9314235, INT-9605227, and DMR-9802476, to the University of Missouri Research Reactor, to the donors of The Petroleum Research Fund administered by the ACS, and to the US Department of Energy under Grant No. DE-FG02-85ER45183 of the MATRIX Participating Research Team for partial support of this research.

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