Abstract
Highly N-doped (mid-1019 to >1020 cm-3) ZnTe/(001)GaAs epitaxial films have been grown by pulsed laser ablation (PLA) of a stoichiometric ZnTe target in a high-purity N2 ambient (50 to 200 mTorr) without the use of any assisting dc or ac plasma source. Unlike recent experiments in which atomic N, extracted from dc and rf plasma sources, was used to produce N-doping during molecular beam epitaxy, spectroscopic measurements performed during PLA of ZnTe in N2 do not reveal the presence of atomic N. This suggests that the high hole concentrations in laser ablated ZnTe are produced by a new mechanism, possibly energetic beam-induced reactions with excited N2 adsorbed on the film surface, and/or transient formation of Zn-N complexes in the energetic ablation plume.
Original language | English |
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Pages (from-to) | 2545 |
Number of pages | 1 |
Journal | Applied Physics Letters |
Volume | 67 |
DOIs | |
State | Published - 1995 |