Growth of epitaxial y2O3 film on biaxially textured Ni-W substrates

M. S. Bhuiyan; M. Paranthaman; S. Sathyamurthy; T. Aytug; S. Kang; D. F. Lee; A. Goyal; E. A. Payzant; K. Salama

Growth of epitaxial y₂O₃ film on biaxially textured Ni-W substrates

M. S. Bhuiyan, M. Paranthaman, S. Sathyamurthy, T. Aytug, S. Kang, D. F. Lee, A. Goyal, E. A. Payzant, K. Salama

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

We have grown epitaxial Y₂O₃ buffer layers on biaxially textured Ni-W substrates using a newly developed metal organic decomposition (MOD) approach. Precursor solution of 0.25M concentration was spin coated on short samples of Ni-3 at.%W (Ni-W) substrates and heat-treated at 1150°C in a gas mixture of Ar-4%H₂ for an hour. Detailed X-Ray studies indicate that Y₂O₃ films has good out-of-plane and in-plane textures with full-width-half-maximum values of 6.22° and 7.51°, respectively. SEM investigations of Y₂O₃ films reveal a fairly dense microstructure without cracks and porosity. It is possible to use this MOD Y₂O₃ template for growing high current density YBCO films.

Original language	English
Article number	EE4.5
Pages (from-to)	57-59
Number of pages	3
Journal	Materials Research Society Symposium Proceedings
Volume	EXS
Issue number	3
State	Published - 2004
Event	2003 MRS Fall Meeting - Boston, MA, United States Duration: Dec 1 2003 → Dec 4 2003

Cite this

@article{c5a630a781ea42b488e88ffd8f278c42,

title = "Growth of epitaxial y2O3 film on biaxially textured Ni-W substrates",

abstract = "We have grown epitaxial Y2O3 buffer layers on biaxially textured Ni-W substrates using a newly developed metal organic decomposition (MOD) approach. Precursor solution of 0.25M concentration was spin coated on short samples of Ni-3 at.%W (Ni-W) substrates and heat-treated at 1150°C in a gas mixture of Ar-4%H2 for an hour. Detailed X-Ray studies indicate that Y2O3 films has good out-of-plane and in-plane textures with full-width-half-maximum values of 6.22° and 7.51°, respectively. SEM investigations of Y2O3 films reveal a fairly dense microstructure without cracks and porosity. It is possible to use this MOD Y2O3 template for growing high current density YBCO films.",

author = "Bhuiyan, {M. S.} and M. Paranthaman and S. Sathyamurthy and T. Aytug and S. Kang and Lee, {D. F.} and A. Goyal and Payzant, {E. A.} and K. Salama",

year = "2004",

language = "English",

volume = "EXS",

pages = "57--59",

journal = "Materials Research Society Symposium Proceedings",

issn = "0272-9172",

number = "3",

note = "2003 MRS Fall Meeting ; Conference date: 01-12-2003 Through 04-12-2003",

}

TY - JOUR

T1 - Growth of epitaxial y2O3 film on biaxially textured Ni-W substrates

AU - Bhuiyan, M. S.

AU - Paranthaman, M.

AU - Sathyamurthy, S.

AU - Aytug, T.

AU - Kang, S.

AU - Lee, D. F.

AU - Goyal, A.

AU - Payzant, E. A.

AU - Salama, K.

PY - 2004

Y1 - 2004

N2 - We have grown epitaxial Y2O3 buffer layers on biaxially textured Ni-W substrates using a newly developed metal organic decomposition (MOD) approach. Precursor solution of 0.25M concentration was spin coated on short samples of Ni-3 at.%W (Ni-W) substrates and heat-treated at 1150°C in a gas mixture of Ar-4%H2 for an hour. Detailed X-Ray studies indicate that Y2O3 films has good out-of-plane and in-plane textures with full-width-half-maximum values of 6.22° and 7.51°, respectively. SEM investigations of Y2O3 films reveal a fairly dense microstructure without cracks and porosity. It is possible to use this MOD Y2O3 template for growing high current density YBCO films.

AB - We have grown epitaxial Y2O3 buffer layers on biaxially textured Ni-W substrates using a newly developed metal organic decomposition (MOD) approach. Precursor solution of 0.25M concentration was spin coated on short samples of Ni-3 at.%W (Ni-W) substrates and heat-treated at 1150°C in a gas mixture of Ar-4%H2 for an hour. Detailed X-Ray studies indicate that Y2O3 films has good out-of-plane and in-plane textures with full-width-half-maximum values of 6.22° and 7.51°, respectively. SEM investigations of Y2O3 films reveal a fairly dense microstructure without cracks and porosity. It is possible to use this MOD Y2O3 template for growing high current density YBCO films.

UR - http://www.scopus.com/inward/record.url?scp=23844556463&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:23844556463

SN - 0272-9172

VL - EXS

SP - 57

EP - 59

JO - Materials Research Society Symposium Proceedings

JF - Materials Research Society Symposium Proceedings

IS - 3

M1 - EE4.5

T2 - 2003 MRS Fall Meeting

Y2 - 1 December 2003 through 4 December 2003

ER -

Growth of epitaxial y₂O₃ film on biaxially textured Ni-W substrates

Abstract

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