Growth and characterization of oxide buffer layers for YBCO coated conductors

M. W. Rupich, W. Palm, W. Zhang, E. Siegal, S. Annavarapu, L. Fritzemeier, M. D. Teplitsky, C. Thieme, M. Paranthaman

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Metal oxide films were grown on single crystal oxide substrates and deformation textured metal substrates by a metal organic deposition technique using metal alkoxides as the starting precursor materials. The crystallinity, grain alignment, and morphology of the oxide films depend on the process conditions and the substrate properties. Epitaxial oxide films were grown under a range of oxygen partial pressures and temperatures required for film formation on technologically important metal substrates. YBCO films grown on epitaxial LaAIO3 buffer layers on single crystal SrTiO3 had Jc's of 2.2 MA/cm2 (77K, self-field) demonstrating the quality of the MOD derived oxide films.

Original languageEnglish
Pages (from-to)1527-1530
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume9
Issue number2 PART 2
DOIs
StatePublished - 1999

Funding

Manuscript received September 14, 1998. This work was supported in part by the U.S. Department of Energy under Contract No. DE-FG02-97ER82324. and the U.S. Department of Energy, Division of Materials Sciences, Office of Basic Energy Sciences and Office of Energy Efficiency and Renewable Energy, Office of Utility Technology-Superconductivity Program. The Oak Ridge National Laboratory was managed by Lockheed Martin Energy Research Corporation for the U.S. DOE under contract # DE-AC05-960R22464.

FundersFunder number
Division of Materials Sciences
Lockheed Martin Energy Research Corporation
Office of Utility Technology-Superconductivity Program
U.S. Department of EnergyDE-AC05-960R22464, DE-FG02-97ER82324
Office of Energy Efficiency and Renewable Energy
Basic Energy Sciences

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