Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

Y. Wang; M. A. Larotonda; M. Berrill; B. M. Luther; D. Alessi; J. J. Rocca; M. M. Shakya; S. Gilbertson; Z. Chang; V. N. Shlyaptsev

doi:10.1109/LEOS.2006.279182

Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

Y. Wang
, M. A. Larotonda
, M. Berrill
, B. M. Luther
, D. Alessi
, J. J. Rocca
, M. M. Shakya
, S. Gilbertson
, Z. Chang
, V. N. Shlyaptsev

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	951-952
Number of pages	2
ISBN (Print)	0780395557, 9780780395558
DOIs	https://doi.org/10.1109/LEOS.2006.279182
State	Published - 2006
Externally published	Yes
Event	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada Duration: Oct 29 2006 → Nov 2 2006

Publication series

Name	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)	1092-8081

Conference

Conference	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Country/Territory	Canada
City	Montreal, QC
Period	10/29/06 → 11/2/06

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10.1109/LEOS.2006.279182

Cite this

Wang, Y., Larotonda, M. A., Berrill, M., Luther, B. M., Alessi, D., Rocca, J. J., Shakya, M. M., Gilbertson, S., Chang, Z., & Shlyaptsev, V. N. (2006). Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS (pp. 951-952). Article 4054504 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOS.2006.279182

Wang, Y. ; Larotonda, M. A. ; Berrill, M. et al. / Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc., 2006. pp. 951-952 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

@inproceedings{7e6c44258f9b43c59b5e1faef22346a8,

title = "Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm",

author = "Y. Wang and Larotonda, \{M. A.\} and M. Berrill and Luther, \{B. M.\} and D. Alessi and Rocca, \{J. J.\} and Shakya, \{M. M.\} and S. Gilbertson and Z. Chang and Shlyaptsev, \{V. N.\}",

year = "2006",

doi = "10.1109/LEOS.2006.279182",

language = "English",

isbn = "0780395557",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "951--952",

booktitle = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS",

note = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS ; Conference date: 29-10-2006 Through 02-11-2006",

}

Wang, Y, Larotonda, MA, Berrill, M, Luther, BM, Alessi, D, Rocca, JJ, Shakya, MM, Gilbertson, S, Chang, Z & Shlyaptsev, VN 2006, Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. in 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS., 4054504, Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, Institute of Electrical and Electronics Engineers Inc., pp. 951-952, 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS, Montreal, QC, Canada, 10/29/06. https://doi.org/10.1109/LEOS.2006.279182

Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. / Wang, Y.; Larotonda, M. A.; Berrill, M. et al.
19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc., 2006. p. 951-952 4054504 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

AU - Wang, Y.

AU - Larotonda, M. A.

AU - Berrill, M.

AU - Luther, B. M.

AU - Alessi, D.

AU - Rocca, J. J.

AU - Shakya, M. M.

AU - Gilbertson, S.

AU - Chang, Z.

AU - Shlyaptsev, V. N.

PY - 2006

Y1 - 2006

UR - https://www.scopus.com/pages/publications/39049115483

U2 - 10.1109/LEOS.2006.279182

DO - 10.1109/LEOS.2006.279182

M3 - Conference contribution

AN - SCOPUS:39049115483

SN - 0780395557

SN - 9780780395558

T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

SP - 951

EP - 952

BT - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

Y2 - 29 October 2006 through 2 November 2006

ER -

Wang Y, Larotonda MA, Berrill M, Luther BM, Alessi D, Rocca JJ et al. Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc. 2006. p. 951-952. 4054504. (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). doi: 10.1109/LEOS.2006.279182

Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

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