Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

Y. Wang; M. A. Larotonda; M. Berrill; B. M. Luther; D. Alessi; J. J. Rocca; M. M. Shakya; S. Gilbertson; Z. Chang; V. N. Shlyaptsev

doi:10.1109/LEOS.2006.279182

Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

Y. Wang, M. A. Larotonda, M. Berrill, B. M. Luther, D. Alessi, J. J. Rocca, M. M. Shakya, S. Gilbertson, Z. Chang, V. N. Shlyaptsev

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	951-952
Number of pages	2
ISBN (Print)	0780395557, 9780780395558
DOIs	https://doi.org/10.1109/LEOS.2006.279182
State	Published - 2006
Externally published	Yes
Event	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada Duration: Oct 29 2006 → Nov 2 2006

Publication series

Name	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)	1092-8081

Conference

Conference	19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
Country/Territory	Canada
City	Montreal, QC
Period	10/29/06 → 11/2/06

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10.1109/LEOS.2006.279182

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Wang, Y., Larotonda, M. A., Berrill, M., Luther, B. M., Alessi, D., Rocca, J. J., Shakya, M. M., Gilbertson, S., Chang, Z., & Shlyaptsev, V. N. (2006). Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS (pp. 951-952). Article 4054504 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOS.2006.279182

Wang, Y. ; Larotonda, M. A. ; Berrill, M. et al. / Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc., 2006. pp. 951-952 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

@inproceedings{7e6c44258f9b43c59b5e1faef22346a8,

title = "Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm",

author = "Y. Wang and Larotonda, \{M. A.\} and M. Berrill and Luther, \{B. M.\} and D. Alessi and Rocca, \{J. J.\} and Shakya, \{M. M.\} and S. Gilbertson and Z. Chang and Shlyaptsev, \{V. N.\}",

year = "2006",

doi = "10.1109/LEOS.2006.279182",

language = "English",

isbn = "0780395557",

series = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "951--952",

booktitle = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS",

note = "19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS ; Conference date: 29-10-2006 Through 02-11-2006",

}

Wang, Y, Larotonda, MA, Berrill, M, Luther, BM, Alessi, D, Rocca, JJ, Shakya, MM, Gilbertson, S, Chang, Z & Shlyaptsev, VN 2006, Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. in 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS., 4054504, Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, Institute of Electrical and Electronics Engineers Inc., pp. 951-952, 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS, Montreal, QC, Canada, 10/29/06. https://doi.org/10.1109/LEOS.2006.279182

Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. / Wang, Y.; Larotonda, M. A.; Berrill, M. et al.
19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc., 2006. p. 951-952 4054504 (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

AU - Wang, Y.

AU - Larotonda, M. A.

AU - Berrill, M.

AU - Luther, B. M.

AU - Alessi, D.

AU - Rocca, J. J.

AU - Shakya, M. M.

AU - Gilbertson, S.

AU - Chang, Z.

AU - Shlyaptsev, V. N.

PY - 2006

Y1 - 2006

UR - https://www.scopus.com/pages/publications/39049115483

U2 - 10.1109/LEOS.2006.279182

DO - 10.1109/LEOS.2006.279182

M3 - Conference contribution

AN - SCOPUS:39049115483

SN - 0780395557

SN - 9780780395558

T3 - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

SP - 951

EP - 952

BT - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS

Y2 - 29 October 2006 through 2 November 2006

ER -

Wang Y, Larotonda MA, Berrill M, Luther BM, Alessi D, Rocca JJ et al. Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm. In 19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS. Institute of Electrical and Electronics Engineers Inc. 2006. p. 951-952. 4054504. (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS). doi: 10.1109/LEOS.2006.279182

Generation and pulsewidth characterization of high repetition rate soft x-ray lasers operating at 13.2 nm and 13.9 nm

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