'Fully automated system for the characterization of standard reference resistors using the quantum hall effect.'

J. A. Good, M. L. Allitt, M. Owczarkowki, P. A. Probst

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

The authors have constructed a self-contained, fully automatic system for the characterization of laboratory transfer resistance standards. A novel feature is the integration of all elements into a single cryogenic system. The instrument allows direct comparison of standard resistors with the Quantum Hall resistance in GaAs/GaAlAs heterostructures. At low temperature the Hall voltage exhibits plateaus of constant value as the external magnetic field is increased, corresponding to a Quantum Hall Resistance equal to h/e2n, where h is Planck's constant, e the electron charge and n an integer. The resistance of the transfer standard can therefore be determined from fundamental physical constants.

Original languageEnglish
Pages (from-to)254
Number of pages1
JournalCPEM Digest (Conference on Precision Electromagnetic Measurements)
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 Conference on Precision Electromagnetic Measurements - Braunschweig, Ger
Duration: Jun 17 1996Jun 20 1996

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