From Imaging Conductivity to Imaging Electron Density

Ondrej Dyck, Jawaher Almutlaq, David Lingerfelt, Jacob L. Swett, Bevin Huang, Andrew R. Lupini, Dirk Englund, Stephen Jesse

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)138-139
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

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