From Imaging Conductivity to Imaging Electron Density

Ondrej Dyck, Jawaher Almutlaq, David Lingerfelt, Jacob L. Swett, Bevin Huang, Andrew R. Lupini, Dirk Englund, Stephen Jesse

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)138-139
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

Funding

This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division (O.D. A.R.L., S.J.), and was performed at the Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility. J.A. acknowledges the fund from support from the Army Research Office MURI (Ab-Initio Solid-State Quantum Materials) Grant no. W911NF-18-1-043, from KACST-MIT Ibn Khaldun Fellowship for Saudi Arabian Women, and from Ibn Rushd Postdoctoral award from King Abdullah University of Science and Technology.

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