Formation of secondary iron-sulphur phases during the growth of polycrystalline iron pyrite (FeS2) thin films by MOCVD

B. Thomas, T. Cibik, C. Höpfner, K. Diesner, G. Ehlers, S. Fiechter, K. Ellmer

Research output: Contribution to journalArticlepeer-review

55 Scopus citations

Abstract

Thin films of iron pyrite (FeS2) have been prepared on glass and glassy carbon substrates by low pressure metal organic chemical vapour deposition (LP-MOCVD) using iron pentacarbonyl (Fe(CO)5) and di-tert.-butyldisulphide (TBDS) as precursors. The TBDS partial pressure was varied from 1 to 100 Pa for different iron pentacarbonyl partial pressures (0.25, 0.5 and 1 Pa) while all other parameters were maintained constant. It was found that there is a critical TBDS-partial pressure of about 30 Pa for a deposition temperature of 475°C, where a drastic change in the layer properties occurs. Below this TBDS partial pressure pyrrhotite type phases (Fe1-xS) will be formed although there is a sulphur precursor excess in the gas phase. If the layers contain pyrrhotite, the electrical properties of the FeSx-films are changed significantly. The occurrence of the pyrrhotite phases does not depend on the growth rate, hence it is not controlled kinetically. Therefore, the sulphur pressure above the growing pyrite film is the important parameter controlling the solid phase. The present investigation shows that, in order to prepare pyrite thin films of good electronic quality, one has to take care to avoid the secondary sulphur-iron phases even in very small concentrations.

Original languageEnglish
Pages (from-to)61-64
Number of pages4
JournalJournal of Materials Science: Materials in Electronics
Volume9
Issue number1
DOIs
StatePublished - 1998
Externally publishedYes

Fingerprint

Dive into the research topics of 'Formation of secondary iron-sulphur phases during the growth of polycrystalline iron pyrite (FeS2) thin films by MOCVD'. Together they form a unique fingerprint.

Cite this