Flux-pinning-related defect structures in melt-processed YBa2Cu3O7-x

Z. L. Wang; R. Kontra; A. Goyal; D. M. Kroeger; L. F. Allard

Flux-pinning-related defect structures in melt-processed YBa₂Cu₃O_7-x

Z. L. Wang
, R. Kontra
, A. Goyal
, D. M. Kroeger
, L. F. Allard

Applied Microanalysis and Thermophysics

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper presents an HRTEM study of stacking faults in YBa₂Cu₃O_7-x. These defects are found oriented parallel to the basal plane near the Y211/Y123 interfaces. Stacking faults arise from either excess single Cu-O layers or double Cu-O and Y-O layers. A new type of defect was also observed.

Original language	English
Pages (from-to)	936-937
Number of pages	2
Journal	Proceedings - Annual Meeting, Microscopy Society of America
State	Published - 1993
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

Cite this

@article{1a8bc2eb75dd4bf28da9836067bd442c,

title = "Flux-pinning-related defect structures in melt-processed YBa2Cu3O7-x",

abstract = "This paper presents an HRTEM study of stacking faults in YBa2Cu3O7-x. These defects are found oriented parallel to the basal plane near the Y211/Y123 interfaces. Stacking faults arise from either excess single Cu-O layers or double Cu-O and Y-O layers. A new type of defect was also observed.",

author = "Wang, \{Z. L.\} and R. Kontra and A. Goyal and Kroeger, \{D. M.\} and Allard, \{L. F.\}",

year = "1993",

language = "English",

pages = "936--937",

journal = "Proceedings - Annual Meeting, Microscopy Society of America",

issn = "0424-8201",

note = "Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

}

TY - JOUR

T1 - Flux-pinning-related defect structures in melt-processed YBa2Cu3O7-x

AU - Wang, Z. L.

AU - Kontra, R.

AU - Goyal, A.

AU - Kroeger, D. M.

AU - Allard, L. F.

PY - 1993

Y1 - 1993

N2 - This paper presents an HRTEM study of stacking faults in YBa2Cu3O7-x. These defects are found oriented parallel to the basal plane near the Y211/Y123 interfaces. Stacking faults arise from either excess single Cu-O layers or double Cu-O and Y-O layers. A new type of defect was also observed.

AB - This paper presents an HRTEM study of stacking faults in YBa2Cu3O7-x. These defects are found oriented parallel to the basal plane near the Y211/Y123 interfaces. Stacking faults arise from either excess single Cu-O layers or double Cu-O and Y-O layers. A new type of defect was also observed.

UR - https://www.scopus.com/pages/publications/0027704933

M3 - Conference article

AN - SCOPUS:0027704933

SN - 0424-8201

SP - 936

EP - 937

JO - Proceedings - Annual Meeting, Microscopy Society of America

JF - Proceedings - Annual Meeting, Microscopy Society of America

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -

Flux-pinning-related defect structures in melt-processed YBa₂Cu₃O_7-x

Abstract

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