Abstract
In additive manufacturing (AM), internal flaws that form during processing can have a detrimental impact on the resulting fatigue behavior of the component. Nondestructive x-ray computed tomography (XCT) has been routinely used to inspect AM components. This technique, however, is limited by what is resolvable as well as the automated procedures available to analyze the data. In this study, we compared XCT scans and automated flaw recognition analysis of the corresponding data to results obtained from an automated mechanical polishing-based serial sectioning system. Although internal porosity and surface roughness were easily observed by serial sectioning with bright-field optical microscopy, the same level of information could not be obtained from the XCT data. For the acquisition parameters used, XCT had only a 15.7% detection rate compared to that of serial sectioning. The results point to the need to recognize the limitations of XCT and for supplementary XCT scan quality metrics in addition to the voxel size.
| Original language | English |
|---|---|
| Pages (from-to) | 4958-4964 |
| Number of pages | 7 |
| Journal | Journal of Materials Engineering and Performance |
| Volume | 30 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2021 |
| Externally published | Yes |
Funding
The authors would like to acknowledge the Office of Naval Research Manufacturing Technology program and the Applied Research Laboratory’s Institute for Manufacturing and Sustainment Technologies, which is funded under the Naval Sea Systems Command (NAVSEA) contract #N00024-12-D-6404, as well as UES SBIR, Phase I Z4.05-6355, NASA Contract: 80NSSC20C0360. The authors also wish to thank the Center for Innovative Materials Processing through Direct Digital Deposition (CIMP-3D) for the use of their equipment and laboratory facilities. The authors would like to acknowledge the Office of Naval Research Manufacturing Technology program and the Applied Research Laboratory’s Institute for Manufacturing and Sustainment Technologies, which is funded under the Naval Sea Systems Command (NAVSEA) contract #N00024-12-D-6404, as well as UES SBIR, Phase I Z4.05-6355, NASA Contract: 80NSSC20C0360. The authors also wish to thank the Center for Innovative Materials Processing through Direct Digital Deposition (CIMP-3D) for the use of their equipment and laboratory facilities.
Keywords
- additive manufacturing
- advanced characterization
- nondestructive testing
- optical microscopy
Fingerprint
Dive into the research topics of 'Flaw Identification in Additively Manufactured Parts Using X-ray Computed Tomography and Destructive Serial Sectioning'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver