Flat-surface-assisted and self-regulated oxidation resistance of Cu(111)

Su Jae Kim, Yong In Kim, Bipin Lamichhane, Young Hoon Kim, Yousil Lee, Chae Ryong Cho, Miyeon Cheon, Jong Chan Kim, Hu Young Jeong, Taewoo Ha, Jungdae Kim, Young Hee Lee, Seong Gon Kim, Young Min Kim, Se Young Jeong

Research output: Contribution to journalArticlepeer-review

83 Scopus citations

Abstract

Oxidation can deteriorate the properties of copper that are critical for its use, particularly in the semiconductor industry and electro-optics applications1–7. This has prompted numerous studies exploring copper oxidation and possible passivation strategies8. In situ observations have, for example, shown that oxidation involves stepped surfaces: Cu2O growth occurs on flat surfaces as a result of Cu adatoms detaching from steps and diffusing across terraces9–11. But even though this mechanism explains why single-crystalline copper is more resistant to oxidation than polycrystalline copper, the fact that flat copper surfaces can be free of oxidation has not been explored further. Here we report the fabrication of copper thin films that are semi-permanently oxidation resistant because they consist of flat surfaces with only occasional mono-atomic steps. First-principles calculations confirm that mono-atomic step edges are as impervious to oxygen as flat surfaces and that surface adsorption of O atoms is suppressed once an oxygen face-centred cubic (fcc) surface site coverage of 50% has been reached. These combined effects explain the exceptional oxidation resistance of ultraflat Cu surfaces.

Original languageEnglish
Pages (from-to)434-438
Number of pages5
JournalNature
Volume603
Issue number7901
DOIs
StatePublished - Mar 17 2022
Externally publishedYes

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