| Original language | English |
|---|---|
| Pages (from-to) | 110-111 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 10 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - 2004 |
| Externally published | Yes |
First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM
L. F. Allard, D. A. Blom, M. A. O'Keefe, C. Kiely, D. Ackland, M. Watanabe, M. Kawasaki, T. Kaneyama, H. Sawada
Research output: Contribution to journal › Article › peer-review
4
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