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First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM

  • L. F. Allard
  • , D. A. Blom
  • , M. A. O'Keefe
  • , C. Kiely
  • , D. Ackland
  • , M. Watanabe
  • , M. Kawasaki
  • , T. Kaneyama
  • , H. Sawada

Research output: Contribution to journalArticlepeer-review

4 Scopus citations
Original languageEnglish
Pages (from-to)110-111
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
StatePublished - 2004
Externally publishedYes

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