Original language | English |
---|---|
Pages (from-to) | 110-111 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 10 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - 2004 |
Externally published | Yes |
First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM
L. F. Allard, D. A. Blom, M. A. O'Keefe, C. Kiely, D. Ackland, M. Watanabe, M. Kawasaki, T. Kaneyama, H. Sawada
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations