First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM

L. F. Allard, D. A. Blom, M. A. O'Keefe, C. Kiely, D. Ackland, M. Watanabe, M. Kawasaki, T. Kaneyama, H. Sawada

Research output: Contribution to journalArticlepeer-review

4 Scopus citations
Original languageEnglish
Pages (from-to)110-111
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
StatePublished - 2004
Externally publishedYes

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