Field-test results of an image retrieval system for semiconductor yield learning

Engineering

• Retrieval System 100%
• Field Test Result 100%
• Oak Ridge 50%
• Layer Processing 50%
• Position Information 50%
• Manufacturing Process 50%
• Field Test 50%
• Image Information 50%

Computer Science

• Image Retrieval System 100%
• Content-based image retrieval 50%
• Diagnose Problem 50%
• Database Table 50%
• Image Information 50%
• Causal Relationship 50%
• Position Information 50%